Performance Improvement in E-Gun Deposited SiOx- Based RRAM Device by Switching Material Thickness Reduction
- Title
- Performance Improvement in E-Gun Deposited SiOx- Based RRAM Device by Switching Material Thickness Reduction
- Description
- Journal of Physics: Conference Series Vol.2161 Issue.1
- Creator
- Roy S.; Maikap S.
- Source
- <a href="https://www.scopus.com/inward/record.uri?eid=2-s2.0-85124706968&doi=10.1088%2f1742-6596%2f2161%2f1%2f012040&partnerID=40&md5=75c274bf9a6248b934ee492402e3770a" target="_blank" rel="noreferrer noopener">https://www.scopus.com/inward/record.uri?eid=2-s2.0-85124706968&doi=10.1088%2f1742-6596%2f2161%2f1%2f012040&partnerID=40&md5=75c274bf9a6248b934ee492402e3770a</a>
- Date
- 2022-01-01
Collection
Citation
Roy S.; Maikap S., “Performance Improvement in E-Gun Deposited SiOx- Based RRAM Device by Switching Material Thickness Reduction,” CHRIST (Deemed To Be University) Institutional Repository, accessed February 8, 2025, https://archives.christuniversity.in/items/show/10416.