Growth and characterization of InBi1-xSbx InBi1-xTex and γ-In2Se3 crystals

Title

Growth and characterization of InBi1-xSbx InBi1-xTex and γ-In2Se3 crystals

Creator

Ajayakumar, C J

Contributor

A G, Kunjomana

Description

Theory and innovating practices of crystal growth heralded cutting edge breakthroughs in the production of proficient crystals towards the advancement of science and technology. Unique characteristics and band structure provide great flexibility for structural design and band gap engineering of indium bismuthide (InBi) compounds. Substitution of antimony and tellurium elements results in the transition of InBi to a semiconducting state with narrow energy gap, making it suitable for optoelectronic devices. Need of eco-friendly sustainable processes concerning the elimination of hazardous materials bring and#947;-In2Se3 in the forefront of photovoltaic industry, due to its wide band gap as well as n-type conductivity. Thus, realizing the immense potential attributes of InBi1-xSbx, InBi1-xTex (x = 0-0.2) and and#947;-In2Se3 crystals, the present research was focussed on pioneering their growth and characterization.Horizontal directional solidification (HDS), being the versatile, inexpensive melt growth technique, was employed for obtaining InBi1-xSbx, and InBi1-xTex (x = 0-0.2) crystals. On the other hand, closed tube sublimation (CTS) was found to be most effective for deposition of and#947;-In2Se3 crystals. Platelet and spherulitic morphologies of and#947;-In2Se3 crystals have been grown by the vapor deposition for the first time, under different growth environments. Morphology, structure and quality of the as-grown crystals were studied, employing various scientific procedures such as X-ray diffraction (XRD), energy dispersive analysis by X-rays (EDAX), scanning electron microscopy (SEM), atomic force microscopy (AFM) and transmission electron microscopy (TEM). Transport parameters, melting point and phase purity have been evaluated with the aid of Hall effect measurement, four probe set up, differential scanning calorimetry (DSC) and Raman spectroscopy. Vickers indentation testing was utilized for the evaluation of microhardness and deformation characteristics.

Source

Author's Submission

Date

2017-01-01

Publisher

Christ(Deemed to be University)

Subject

Physics and Electronics

Rights

Open Access

Relation

61000060

Format

PDF

Language

English

Type

PhD

Identifier

http://hdl.handle.net/10603/149874