Studies on K X Ray fluorescence parameters of low and medium Z elements

Title

Studies on K X Ray fluorescence parameters of low and medium Z elements

Creator

Anand L, Francis Maria

Contributor

Gudennavar, Shivappa B

Description

K X-ray fluorescence parameters for pure elements have been determined using different single and double reflection geometry by several researchers over the years. Horakeri et al.have shown that the K X-ray fluorescence parameters can also be determined by a simple 2and#960;-geometrical configuration method and a NaI(Tl) detector spectrometer for high Z elements. newlineHowever, in order to study the K XRF parameters for low Z elements, high resolution detector spectrometers are required.But in high resolution detectors like HPGe and Si(Li), due to the gap between window and the active area of the detector, the solid angle subtended by the detector at the target is not 2and#960;. Hence a suitable geometry correction is required for accurate newlinemeasurement of incident photons and the emitted K X-ray photons in order to determine the K XRF parameters in low Z elements. In the present study, employing a nearly 2and#960;-geometrical configuration and applying suitable geometry correction, we have determined the K X-ray fluorescence parameters of a few low and medium Z elements in the range of 27 and#8804; Z and#8804; 30 and 42 and#8804; Z and#8804; 47 respectively. The elements were procured in the form of thin foils and were irradiated by a weak radioactive source. The emitted K X-ray photons were detected using a low energy high resolution HPGe detector spectrometer. The incident photons, emitted K X-ray photons and the transmitted photons at newlinethe incident energy is measured and were corrected for window attenuation, efficiency, self-attenuation and geometry correction newlineto obtain the true intensities of incident photons, emitted K Xray photons and the transmitted photons at the incident energy.

Source

Author's Submission

Date

2018-01-01

Publisher

Christ(Deemed to be University)

Subject

Physics and Electronics

Rights

Open Access

Relation

61000081

Format

PDF

Language

English

Type

PhD

Identifier

http://hdl.handle.net/10603/316662