A generalized software reliability prediction model for module based software incorporating testing effort with cost model
- Title
- A generalized software reliability prediction model for module based software incorporating testing effort with cost model
- Creator
- Yadav A.K.; Srivastava S.; Pant M.
- Description
- As software innovation has advanced, it has been noted that the testing effort function (TEF) is one of the key factors influencing the improvement of software reliability. This paper presents a simplified model which incorporates the testing effort for the reliability growth of a software. A closed form solution has been derived for the reliability of the software. This study examines the impact of testing efforts on a software reliability model based on NHPP. The sensitivity analysis has been made available to investigate how the created model's system parameters affect the cost function, mean value function, and softwares reliability. The parameters of the model have been estimated using the non-linear least square estimation (MLE) method in MATLAB software. Additionally, a warranty cost model is constructed to assess the optimal release policy for the software. The general form of the reliability expression involves elliptic integrals, which can be computed easily through a software like Mathematica. We have derived analytical solutions for reliability pertaining to several particular cases. Optimal release time for the software product has been calculated for some particular cost-sets. Goodness of fit curves have been plotted to compare the proposed model with some well-known existing SRGMs. Numerical illustrations are provided to bolster the analytical outcomes. The Author(s), under exclusive licence to Society for Reliability and Safety (SRESA) 2024.
- Source
- Life Cycle Reliability and Safety Engineering, Vol-13, No. 4, pp. 419-436.
- Date
- 2024-01-01
- Publisher
- Springer
- Subject
- Maximum likelihood estimation (MLE); Non-homogeneous Poisson process (NHPP); Optimal release time (ORT); Software reliability growth model (SRGM); Testing effort function (TEF); Warranty cost model
- Coverage
- Yadav A.K., Department of Applied Mathematics and Scientific Computing, Indian Institute of Technology, Roorkee, 247001, India; Srivastava S., Christ University, Karnataka, Bengaluru, 560029, India; Pant M., Department of Applied Mathematics and Scientific Computing, Indian Institute of Technology, Roorkee, 247001, India, Mehta Family School of Data Science and Artificial Intelligence, Indian Institute of Technology, Roorkee, 247667, India
- Rights
- Restricted Access
- Relation
- ISSN: 25201352
- Format
- Online
- Language
- English
- Type
- Article
Collection
Citation
Yadav A.K.; Srivastava S.; Pant M., “A generalized software reliability prediction model for module based software incorporating testing effort with cost model,” CHRIST (Deemed To Be University) Institutional Repository, accessed April 26, 2025, https://archives.christuniversity.in/items/show/12612.