Dublin Core The Dublin Core metadata element set is common to all Omeka records, including items, files, and collections. For more information see, http://dublincore.org/documents/dces/. Title A name given to the resource Articles Article Faculty Publications -Articles Dublin Core The Dublin Core metadata element set is common to all Omeka records, including items, files, and collections. For more information see, http://dublincore.org/documents/dces/. Title A name given to the resource Mechanical Properties and Analysis of Two-body Abrasive Wear Behaviour of Graphene Modified Carbon/Epoxy Composites Using Taguchis Technique Subject The topic of the resource ANOVA; Carbon-epoxy; Graphene nanoplatelets; Specific wear rate; Taguchi technique; Wear mechanisms Description An account of the resource The present work emphasizes the effect of graphene nanoplatelets (G) filler loading on mechanical and abrasive wear behavior of carbon fibre reinforced epoxy (C/E) composites. Graphene nanoplatelets were mixed with epoxy framework using a temperature-controlled magnetic stirrer and then ultrasonically treated. The parameters considered for the abrasive wear study are the applied load in N (5, 10 and 15), abrading distance in m (75, 150, and 225) and weight percentage of reinforcement (0, 1, and 1.5). The incorporation of 1 wt. % G into C/E composites increases hardness by 14 % and interlaminar laminar strength by 19 % when compared to C/E composites. According to the Taguchi design of tests, a filler loading of 1 wt. % G, an abrading distance of 225 m, and an applied load of 15 N are ideal. Analysis of variance (ANOVA) was done to establish the dominant parameter, and the filler loading with abrading distance was shown to be significant. With 36.4 %, the filler loading had the biggest influence on the composite specific wear rate. The combination of filler loading with 1 wt. %, load of 15 N, and abrading distance of 225 m yields the lowest specific wear rate. The involved wear mechanisms during the abrasive wear process have also been explained with scanning electron micrographs. 2024 Published by Faculty of Engineering. Creator An entity primarily responsible for making the resource Shivamurthy A.; Boranna R.; Jagannat R.K.; Prashanth G.R.; Bheemappa S.; Darshan S.M. Source A related resource from which the described resource is derived Tribology in Industry, Vol-46, No. 1, pp. 66-79. Publisher An entity responsible for making the resource available Faculty of Engineering, University of Kragujevac Date A point or period of time associated with an event in the lifecycle of the resource 2024-01-01 Identifier An unambiguous reference to the resource within a given context <a href="https://doi.org/10.24874/ti.1512.07.23.09" target="_blank" rel="noreferrer noopener">https://doi.org/10.24874/ti.1512.07.23.09</a> <br /><br /><a href="https://www.scopus.com/inward/record.uri?eid=2-s2.0-85186938594&amp;doi=10.24874%2Fti.1512.07.23.09&amp;partnerID=40&amp;md5=8e9a9d3f73fe8fa1d151c526356b1a49" target="_blank" rel="noreferrer noopener">https://www.scopus.com/inward/record.uri?eid=2-s2.0-85186938594&amp;doi=10.24874%2fti.1512.07.23.09&amp;partnerID=40&amp;md5=8e9a9d3f73fe8fa1d151c526356b1a49</a> Rights Information about rights held in and over the resource All Open Access; Gold Open Access Relation A related resource ISSN: 3548996 Format The file format, physical medium, or dimensions of the resource Online Language A language of the resource English Type The nature or genre of the resource Article Coverage The spatial or temporal topic of the resource, the spatial applicability of the resource, or the jurisdiction under which the resource is relevant Shivamurthy A., Department of Electronics and Communication Engineering, National Institute of Technology, Goa, Goa, 403401, India; Boranna R., Department of Electronics and Communication Engineering, JSS Science and Technology University, Karnataka, Mysuru, 570006, India; Jagannat R.K., Department of Applied Science, National Institute of Technology Goa, Goa, 403401, India; Prashanth G.R., Department of Electronics and Communication Engineering, National Institute of Technology, Goa, Goa, 403401, India; Bheemappa S., Department of Mechanical Engineering, The National Institute of Engineering, Karnataka, Mysuru, 570008, India; Darshan S.M., Department of Mechanical and Automobile Engineering, CHRIST (Deemed to be University), Karnataka, Bengaluru, 570008, India