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    <name>Article</name>
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              <text>Architecture of FTO/n-CdS/p-SnSe1-xOx/Au Heterojunction Thin Film Diodes by Thermal Evaporation</text>
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              <text>currentvoltage characteristics; diode; Oxygen-doped SnSe thin film; thermal evaporation</text>
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              <text>In this report, FTO/n-CdS/p-SnSe1-xOx/Au heterojunction diodes were fabricated using a homemade precursor followed by dry milling with a facile thermal evaporation method under oxygen atmosphere (10? 2mbar) for the first time. The chemical purity (45.35:45.07:9.58 at.%) and microstructure of the deposited films and device were characterized by energy dispersive x-ray analysis, x-ray photoelectron spectroscopy, and scanning electron microscopy. The crystallographic parameters, a = 11.512 b = 4.163and c = 4.452 with orthorhombic crystal structure and monophase nature were analyzed by powder x-ray diffraction. Raman spectroscopy revealed the vibrational modes, and UVVis-NIR spectroscopy was used to study the direct nature of optical absorption with a band gap of 1.14eV. The currentvoltage (I-V) characteristics of the semiconductor diode were measured in room temperature (25C) and revealed rectifying properties and the cut-off voltage for the device, 0.57V. The obtained results highlight that the use of a p-SnSe1-xOx (SSO) layer as an interface between n-CdS/Au diodes exhibits excellent rectifying behavior and enhanced diode performance. Therefore, the p-SSO layer is a suitable material for heterojuction diodes and optoelectronic switches. Graphical Abstract: [Figure not available: see fulltext.].  2022, The Minerals, Metals &amp;amp; Materials Society.</text>
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              <text>John B.; Vardhurajaperumal S.</text>
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              <text>Journal of Electronic Materials, Vol-51, No. 12, pp. 6827-6834.</text>
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              <text>2022-01-01</text>
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              <text>&lt;a href="https://doi.org/10.1007/s11664-022-09904-0" target="_blank" rel="noreferrer noopener"&gt;https://doi.org/10.1007/s11664-022-09904-0&lt;/a&gt;
&lt;br /&gt;&lt;br /&gt;&lt;a href="https://www.scopus.com/inward/record.uri?eid=2-s2.0-85139246768&amp;amp;doi=10.1007%2Fs11664-022-09904-0&amp;amp;partnerID=40&amp;amp;md5=b4b9e6bae866a34b40874b4039b5f137" target="_blank" rel="noreferrer noopener"&gt;https://www.scopus.com/inward/record.uri?eid=2-s2.0-85139246768&amp;amp;doi=10.1007%2fs11664-022-09904-0&amp;amp;partnerID=40&amp;amp;md5=b4b9e6bae866a34b40874b4039b5f137&lt;/a&gt;</text>
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              <text>ISSN: 3615235; CODEN: JECMA</text>
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              <text>John B., Department of Physics and Electronics, CHRIST (Deemed to be University), Karnataka, Bangalore, 560029, India; Vardhurajaperumal S., Center for Nanoscience and Engineering (CeNSE), Indian Institute of Science, Bangalore, India</text>
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