Antiferromagnetism of CoO-NiO bilayers studied by XMLD spectroscopy
antiferromagnetism; thin films; x-ray magnetic linear dichroism (XMLD) spectroscopy
CoO-NiO epitaxial bilayer system grown on MgO(001) substrate is investigated using x-ray magnetic linear dichroism (XMLD) spectroscopy with varying CoO overlayer thickness. An analysis of the Ni L 2 edge XMLD spectra using anisotropic XMLD formulation within a two-domain model reveals that the Ni moments undergo a spin reorientation with increasing CoO thickness. Such a spin reorientation is attributed to the competing magnetic interactions at both the NiO film interfaces, suggesting the existence of a sharp horizontal domain wall separating the in-plane and out-of-plane NiO domains. Our study also demonstrates a possible way to investigate the spin-structure along the thickness within the same chemical structure using a model-based approach, in a noninvasive manner. 2021 IOP Publishing Ltd.
Journal of Physics D: Applied Physics, Vol-54, No. 18
https://doi.org/10.1088/1361-6463/abe15c https://www.scopus.com/inward/record.uri?eid=2-s2.0-85101748748&doi=10.1088%2f1361-6463%2fabe15c&partnerID=40&md5=bb7bcb822c792d3ed1bc5e10bd57f42b
Jena B.B., Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, HBNI, 1/AF Bidhannagar, Kolkata, 700064, India; Mandal S., Physics and Electronics Department, CHRIST (Deemed to Be University), Bangalore, 560029, India; Menon K.S.R., Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, HBNI, 1/AF Bidhannagar, Kolkata, 700064, India