Antiferromagnetism of CoO-NiO bilayers studied by XMLD spectroscopy
subject: antiferromagnetism; thin films; x-ray magnetic linear dichroism (XMLD) spectroscopy
description: CoO-NiO epitaxial bilayer system grown on MgO(001) substrate is investigated using x-ray magnetic linear dichroism (XMLD) spectroscopy with varying CoO overlayer thickness. An analysis of the Ni L 2 edge XMLD spectra using anisotropic XMLD formulation within a two-domain model reveals that the Ni moments undergo a spin reorientation with increasing CoO thickness. Such a spin reorientation is attributed to the competing magnetic interactions at both the NiO film interfaces, suggesting the existence of a sharp horizontal domain wall separating the in-plane and out-of-plane NiO domains. Our study also demonstrates a possible way to investigate the spin-structure along the thickness within the same chemical structure using a model-based approach, in a noninvasive manner. 2021 IOP Publishing Ltd.
creator: Jena B.B.; Mandal S.; Menon K.S.R.
source: Journal of Physics D: Applied Physics, Vol-54, No. 18
publisher: IOP Publishing Ltd
date: 2021-01-01
rights: Restricted Access
relation: ISSN: 223727; CODEN: JPAPB
format: Online
language: English
type: Article
coverage: Jena B.B., Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, HBNI, 1/AF Bidhannagar, Kolkata, 700064, India; Mandal S., Physics and Electronics Department, CHRIST (Deemed to Be University), Bangalore, 560029, India; Menon K.S.R., Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, HBNI, 1/AF Bidhannagar, Kolkata, 700064, India