Dublin Core The Dublin Core metadata element set is common to all Omeka records, including items, files, and collections. For more information see, http://dublincore.org/documents/dces/. Title A name given to the resource Articles Article Faculty Publications -Articles Dublin Core The Dublin Core metadata element set is common to all Omeka records, including items, files, and collections. For more information see, http://dublincore.org/documents/dces/. Title A name given to the resource A Deep Learning Model for Information Loss Prevention from Multi-Page Digital Documents Subject The topic of the resource artificial neural network; binary classification; data loss prevention; Information security; multi-layer perceptron; title insurance Description An account of the resource World Wide Web has redefined almost all the business models in the past twenty-five to thirty years. IoT, Big Data, AI are some of the comparatively recent technologies which brought in a revolution in the digitization and management of data. Along with the revolution arose the need for data security and consumer privacy protection, primarily concerning financial institutions. The data breach of Equifax in 2017 and personal information leaks from Facebook in 2021 led to general skepticism among the customers of large corporations. The GLBA, 1999, also known as the Financial Modernization Act, was implemented by US federal law to enforce the financial institutions to protect their private information. Built upon the GLBA, guidelines are paved by FTC for all financial institutions of the United States of America, including TI companies. In this paper, an ANN-based content classification technique using MLP architecture in combination with n-gram TF-IDF feature descriptor is proposed to detect and protect the customers' sensitive information of a reputed TI company securing it's one of the digital image-document stores. The proposed technique is compared with other state-of-the-art strategies. Data samples from the digital document store of the company have been taken into consideration in the study, and the prediction accuracy metrics obtained are found to be substantially better and within the acceptable range defined by the organization's information security monitoring team. 2013 IEEE. Creator An entity primarily responsible for making the resource Guha A.; Samanta D.; Banerjee A.; Agarwal D. Source A related resource from which the described resource is derived IEEE Access, Vol-9, pp. 80451-80465. Publisher An entity responsible for making the resource available Institute of Electrical and Electronics Engineers Inc. Date A point or period of time associated with an event in the lifecycle of the resource 2021-01-01 Identifier An unambiguous reference to the resource within a given context <a href="https://doi.org/10.1109/ACCESS.2021.3084841" target="_blank" rel="noreferrer noopener">https://doi.org/10.1109/ACCESS.2021.3084841</a> <br /><br /><a href="https://www.scopus.com/inward/record.uri?eid=2-s2.0-85107197542&amp;doi=10.1109%2FACCESS.2021.3084841&amp;partnerID=40&amp;md5=6547c4373370da8e56e5c19b9c78d5df" target="_blank" rel="noreferrer noopener">https://www.scopus.com/inward/record.uri?eid=2-s2.0-85107197542&amp;doi=10.1109%2fACCESS.2021.3084841&amp;partnerID=40&amp;md5=6547c4373370da8e56e5c19b9c78d5df</a> Rights Information about rights held in and over the resource All Open Access; Gold Open Access Relation A related resource ISSN: 21693536 Format The file format, physical medium, or dimensions of the resource Online Language A language of the resource English Type The nature or genre of the resource Article Coverage The spatial or temporal topic of the resource, the spatial applicability of the resource, or the jurisdiction under which the resource is relevant Guha A., Department of Data Science, CHRIST (Deemed to Be University), Bengaluru, 560029, India, First American India Private Ltd., Bengaluru, 560038, India; Samanta D., Department of Computer Science, CHRIST (Deemed to Be University), Bengaluru, 560029, India; Banerjee A., Department of Electrical and Computer Engineering, Microelectronic Technologies and Devices, National University of Singapore, Singapore, 119077, Singapore; Agarwal D., Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, 19104, PA, United States, Lam Research Corporation, Fremont, 94538, CA, United States