Microhardness studies of GaTe whiskers

Title

Microhardness studies of GaTe whiskers

Creator

Kunjomana A.G.; Chandrasekharan K.A.

Description

Single crystal whiskers of gallium telluride (GaTe) have been grown by the physical vapour deposition (PVD) method. Microindentation studies were carried out on the prism faces of the needles to understand their mechanical behaviour. The variation in the microhardnessof GaTe crystals with applied load has been determined at room temperature using Vickers microhardness indenter. The work- hardening exponent has also been computed for different load regions. 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Source

Crystal Research and Technology, Vol-40, No. 8, pp. 782-785.

Date

2005-01-01

Subject

Crack propagation; GaTe; Physical vapour deposition (PVD); Vickers microhardness; Whiskers

Coverage

Kunjomana A.G., P. G. Department of Physics, Christ College, Bangalore - 560 029, Karnataka, India; Chandrasekharan K.A., P. G. Department of Physics, Christ College, Bangalore - 560 029, Karnataka, India

Rights

Restricted Access

Relation

ISSN: 2321300; CODEN: CRTED

Format

Online

Language

English

Type

Article

Identifier

https://doi.org/10.1002/crat.200410431

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