Identifying a Range of Important Issues to Improve Crop Production
accuracy; agriculture; classifiers; Crop; Machine Learning; Predictive Techniques
Crop yield production value update has a beneficial practical impact on directing agricultural production and informing farmers of changes in crop market prices. The main objective of the suggested method is to put the crop selection technique into practise so that it may be used to address a variety of issues facing farmers and the agricultural industry. As a result, the yield rate of crop production is maximised, which benefits our Indian economy. land conditions of several kinds. So, using a ranking system, the quality of the crops are determined. This procedure also alerts farmers to the rate of crops of low and high quality. Due to the use of multiple classifiers, using an ensemble of classifiers paves the way for better prediction decisions. The decision-making process for selecting the output of the classifiers also incorporates a rating system. The price of a crop that will produce more is predicted using this method. 2023 IEEE.
Geetha C.; Thaiyalnayaki S.; Vetriveeran D.; Jeyanthi P.; Selvapriya B.
2023 9th International Conference on Advanced Computing and Communication Systems, ICACCS 2023, pp. 522-525.
Institute of Electrical and Electronics Engineers Inc.
https://doi.org/10.1109/ICACCS57279.2023.10112663 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85159766498&doi=10.1109%2fICACCS57279.2023.10112663&partnerID=40&md5=ab4cdf2bfb599463fd814f3b67c3b271
Geetha C., Sathyabama Institute of Science & Technology, Department of IT, Chennai, India; Thaiyalnayaki S., Bharath Institute of Higher Education and Research, Department of CSE, Chennai, India; Vetriveeran D., Bharath Institute of Higher Education and Research, Department of CSE, Chennai, India, CHRIST (Deemed to Be University), Department of CSE, Kengeri Campus, Bangalore, India; Jeyanthi P., Sathyabama Institute of Science & Technology, Department of IT, Chennai, India; Selvapriya B., Bharath Institute of Higher Education and Research, Department of CSE, Chennai, India