Dublin Core The Dublin Core metadata element set is common to all Omeka records, including items, files, and collections. For more information see, http://dublincore.org/documents/dces/. Title A name given to the resource Conference Papers Conference Paper Faculty Publications- Conference Papers Dublin Core The Dublin Core metadata element set is common to all Omeka records, including items, files, and collections. For more information see, http://dublincore.org/documents/dces/. Title A name given to the resource A Pre-trained YOLO-v5 model and an Image Subtraction Approach for Printed Circuit Board Defect Detection Subject The topic of the resource automatic optical inspection; computer vision; defect detection; electronic manufacturing; image subtraction; printed circuit board; structural similarity index; YOLO-v5 Description An account of the resource Almost every electronic product used regularly contains printed circuit boards, which in addition to being used for business purposes are also used for security applications. Manual visual inspection of anomalies and faults in circuit boards during manufacture and usage is extremely challenging. Due to a shortage of training data and the uncertainty of new abnormalities, identifying undiscovered flaws continues to be complicated. The YOLO-v5 technique on a customized PCB dataset is used in the study to incorporate computer vision to detect six potential PCB defects. The algorithm is designed to be feasible, deliver precise findings, and operate at a considerable pace to be effective. A technique of image subtraction is also implemented to detect flaws in printed circuit boards. The structural similarity index, a perception-based method, gauges how similar non-defective and defective PCB images are to one another. 2023 IEEE. Creator An entity primarily responsible for making the resource Lailesh A.K.; Richi J.A.; Preethi N. Source A related resource from which the described resource is derived Proceedings of the International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics, ICIITCEE 2023, pp. 140-145. Publisher An entity responsible for making the resource available Institute of Electrical and Electronics Engineers Inc. Date A point or period of time associated with an event in the lifecycle of the resource 2023-01-01 Identifier An unambiguous reference to the resource within a given context <a href="https://doi.org/10.1109/IITCEE57236.2023.10090861" target="_blank" rel="noreferrer noopener">https://doi.org/10.1109/IITCEE57236.2023.10090861</a> <br /><br /><a href="https://www.scopus.com/inward/record.uri?eid=2-s2.0-85156155131&amp;doi=10.1109%2FIITCEE57236.2023.10090861&amp;partnerID=40&amp;md5=b616912d6fe43a502b361c1f7a2c88f3" target="_blank" rel="noreferrer noopener">https://www.scopus.com/inward/record.uri?eid=2-s2.0-85156155131&amp;doi=10.1109%2fIITCEE57236.2023.10090861&amp;partnerID=40&amp;md5=b616912d6fe43a502b361c1f7a2c88f3</a> Rights Information about rights held in and over the resource Restricted Access Relation A related resource ISBN: 978-166546263-1 Format The file format, physical medium, or dimensions of the resource Online Language A language of the resource English Type The nature or genre of the resource Conference paper Coverage The spatial or temporal topic of the resource, the spatial applicability of the resource, or the jurisdiction under which the resource is relevant Lailesh A.K., Christ University, Department. of Data Science, Lavasa, Pune, India; Richi J.A., Christ University, Department. of Data Science, Lavasa, Pune, India; Preethi N., Christ University, Department. of Data Science, Lavasa, Pune, India