X -ray diffraction and microhardness studies of tin monoselenide
- Title
- X -ray diffraction and microhardness studies of tin monoselenide
- Creator
- Sreedevi K.R.; Chandrasekharan K.A.; Kunjomana A.G.
- Description
- Tin Monoselenide (SnSe) crystals have been grown by the Physical Vapour Deposition (PVD) method. X-ray diffraction studies were carried out on the as grown crystals and the lattice parameters were found to be a=11.506 b=4.149and c=4.447 The values were found to be comparable with that reported in the PDF card for SnSe. The microhardness of the crystals has been determined by using Vickers microhardness indenter. 2011 American Institute of Physics.
- Source
- AIP Conference Proceedings, Vol-1349, No. PART A, pp. 1299-1300.
- Date
- 2011-01-01
- Subject
- microhardness; Tin monoselenide; x-ray diffraction
- Coverage
- Sreedevi K.R., Department of Physics, Christ University, Bangalore 560 029, Karnataka, India; Chandrasekharan K.A., Department of Physics, Christ University, Bangalore 560 029, Karnataka, India; Kunjomana A.G., Department of Physics, Christ University, Bangalore 560 029, Karnataka, India
- Rights
- Restricted Access
- Relation
- ISSN: 15517616; ISBN: 978-073540905-7
- Format
- Online
- Language
- English
- Type
- Conference paper
Collection
Citation
Sreedevi K.R.; Chandrasekharan K.A.; Kunjomana A.G., “X -ray diffraction and microhardness studies of tin monoselenide,” CHRIST (Deemed To Be University) Institutional Repository, accessed February 23, 2025, https://archives.christuniversity.in/items/show/21052.