Antiferromagnetism of CoO-NiO bilayers studied by XMLD spectroscopy

Title

Antiferromagnetism of CoO-NiO bilayers studied by XMLD spectroscopy

Creator

Jena B.B.; Mandal S.; Menon K.S.R.

Description

CoO-NiO epitaxial bilayer system grown on MgO(001) substrate is investigated using x-ray magnetic linear dichroism (XMLD) spectroscopy with varying CoO overlayer thickness. An analysis of the Ni L 2 edge XMLD spectra using anisotropic XMLD formulation within a two-domain model reveals that the Ni moments undergo a spin reorientation with increasing CoO thickness. Such a spin reorientation is attributed to the competing magnetic interactions at both the NiO film interfaces, suggesting the existence of a sharp horizontal domain wall separating the in-plane and out-of-plane NiO domains. Our study also demonstrates a possible way to investigate the spin-structure along the thickness within the same chemical structure using a model-based approach, in a noninvasive manner. 2021 IOP Publishing Ltd.

Source

Journal of Physics D: Applied Physics, Vol-54, No. 18

Date

2021-01-01

Publisher

IOP Publishing Ltd

Subject

antiferromagnetism; thin films; x-ray magnetic linear dichroism (XMLD) spectroscopy

Coverage

Jena B.B., Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, HBNI, 1/AF Bidhannagar, Kolkata, 700064, India; Mandal S., Physics and Electronics Department, CHRIST (Deemed to Be University), Bangalore, 560029, India; Menon K.S.R., Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, HBNI, 1/AF Bidhannagar, Kolkata, 700064, India

Rights

Restricted Access

Relation

ISSN: 223727; CODEN: JPAPB

Format

Online

Language

English

Type

Article

Identifier

https://doi.org/10.1088/1361-6463/abe15c

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