Dislocation and microindentation analysis of vapour grown Bi 2Te3-xSex whiskers
- Title
- Dislocation and microindentation analysis of vapour grown Bi 2Te3-xSex whiskers
- Creator
- Kunjomana A.G.; Chandrasekharan K.A.
- Description
- The structural defects and microhardness of Bi2Te 3-xSex whiskers (x = 0, 0.2 and 0.4 at % Se) grown by physical vapour deposition (PVD) method have been investigated. Concentric pairs of dislocation loops were observed on the as-grown surfaces of short hexagonal prisms. A systematic study of dislocations in these crystals was carried out by chemical etching technique. The effects of Se doping, annealing and quenching on the mechanical properties have also been studied on the prism faces of Bi 2Te3-xSex whiskers. 2008 WILEY-VCH Verlag GmbH & Co. KGaA.
- Source
- Crystal Research and Technology, Vol-43, No. 6, pp. 594-598.
- Date
- 2008-01-01
- Subject
- Annealing; Bismuth telluride; Dislocation loops; Microhardness; Physical vapour deposition (PVD); Quenching; Stacking faults; Whiskers
- Coverage
- Kunjomana A.G., P.G. Department of Physics, Christ College (Autonomous), Bangalore - 560 029, Karnataka, India; Chandrasekharan K.A., P.G. Department of Physics, Christ College (Autonomous), Bangalore - 560 029, Karnataka, India
- Rights
- Restricted Access
- Relation
- ISSN: 15214079; CODEN: CRTED
- Format
- Online
- Language
- English
- Type
- Article
Collection
Citation
Kunjomana A.G.; Chandrasekharan K.A., “Dislocation and microindentation analysis of vapour grown Bi 2Te3-xSex whiskers,” CHRIST (Deemed To Be University) Institutional Repository, accessed February 24, 2025, https://archives.christuniversity.in/items/show/17353.