Leaf Disease Detection in Crops based on Single-Hidden Layer Feed-Forward Neural Network and Hierarchal Temporary Memory
- Title
- Leaf Disease Detection in Crops based on Single-Hidden Layer Feed-Forward Neural Network and Hierarchal Temporary Memory
- Creator
- Ambashtha K.L.; Awasthi D.K.; Shukla A.K.; Ragamayi S.; Kathiravan M.N.; Chauhan A.
- Description
- Insects, mites, and fungi are common causes in plant disease, which can significantly reduce yields if not addressed promptly. Farmers are losing money as a result of crop illnesses. As the average under cultivation increases, it becomes more of a burden for farmers to keep an eye on everything. In this study, the median filter is used as a preprocessing step to transform the input image into a grayscale representation which used YCbCr color space. Otsu's segmentation is used to divide photographs that contain bright items on a dark background. Feature extraction using Grey Level Co-occurrence Matrix (GLCM). The proposed technique, known as ELM-HTM combines a simple yet adaptable extreme learning machine (ELM) with a Hierarchical Temporal Memory (HTM). This approach outperforms the ELM and HTM model with an accuracy of about 98.8%. 2023 IEEE.
- Source
- Proceedings of the 2nd International Conference on Applied Artificial Intelligence and Computing, ICAAIC 2023, pp. 28-34.
- Date
- 2023-01-01
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Subject
- Extreme Learning Machine (ELM); Grey Level Co-occurrence Matrix (GLCM); Hierarchical Temporal Memory (HTM); Leaf Disease Detection (LDD)
- Coverage
- Ambashtha K.L., Gopal Narayan Singh University, Sasaram, Faculty of Information Technology, Bihar, India; Awasthi D.K., Iftm University, Department of Computer Applications, Uttar Pradesh, Moradabad, India; Shukla A.K., Iftm University, Department of Computer Applications, Uttar Pradesh, Moradabad, India; Ragamayi S., College of Engineering, KoneruLakshmaiah Education Foundation, Vaddeswaram, Department of Engineering Mathematics, Andhra Pradesh, Guntur, India; Kathiravan M.N., Dr. N. G. P Arts and Science College, Department of Biotechnology, Tamil Nadu, Coimbatore, India; Chauhan A., Christ (Deemed to Be University), Department of Life Sciences, Karnataka, Bengaluru, India
- Rights
- Restricted Access
- Relation
- ISBN: 978-166545630-2
- Format
- Online
- Language
- English
- Type
- Conference paper
Collection
Citation
Ambashtha K.L.; Awasthi D.K.; Shukla A.K.; Ragamayi S.; Kathiravan M.N.; Chauhan A., “Leaf Disease Detection in Crops based on Single-Hidden Layer Feed-Forward Neural Network and Hierarchal Temporary Memory,” CHRIST (Deemed To Be University) Institutional Repository, accessed February 24, 2025, https://archives.christuniversity.in/items/show/19936.