A comprehensive review on application of atomic force microscopy in Forensic science
- Title
- A comprehensive review on application of atomic force microscopy in Forensic science
- Creator
- Therassa M.; Aparna N.S.; Jose M.; Dev A.; Isukapatla A.R.
- Description
- The primary objective of forensic investigation of a case is to recognize, identify, locate, and examine the evidence. Microscopy is a technique that provides crucial information for resolving a case or advancing the investigation process by analyzing the evidence obtained from a crime scene. It is often used in conjunction with suitable analytical techniques. Various microscopes are employed; scanning probe microscopes are available in diverse forensic analyses and studies. Among these, the atomic force microscope (AFM) is the most commonly used scanning probe technology, offering a unique morphological and physico-chemical perspective for analyzing multiple pieces of evidence in forensic investigations. Notably, it is a non-destructive technique capable of operating in liquid or air without complex sample preparation. The article delves into a detailed exploration of the applications of AFM in the realms of nanomechanical forensics and nanoscale characterization of forensically significant samples. 2024 Elsevier Ltd and Faculty of Forensic and Legal Medicine
- Source
- Journal of Forensic and Legal Medicine, Vol-105
- Date
- 2024-01-01
- Publisher
- Churchill Livingstone
- Subject
- Atomic force microscopy (AFM); Fingerprint and questioned document (QD); Quartz grain; Surface morphology; Time since deposition (TSD)
- Coverage
- Therassa M., Department of Life Sciences, Christ University, Karnataka, Bengaluru, India; Aparna N.S., Department of Life Sciences, Christ University, Karnataka, Bengaluru, India; Jose M., Department of Life Sciences, Christ University, Karnataka, Bengaluru, India; Dev A., Department of Life Sciences, Christ University, Karnataka, Bengaluru, India; Isukapatla A.R., Department of Life Sciences, Christ University, Karnataka, Bengaluru, India
- Rights
- Restricted Access
- Relation
- ISSN: 1752928X; PubMed ID: 38996743
- Format
- Online
- Language
- English
- Type
- Review
Collection
Citation
Therassa M.; Aparna N.S.; Jose M.; Dev A.; Isukapatla A.R., “A comprehensive review on application of atomic force microscopy in Forensic science,” CHRIST (Deemed To Be University) Institutional Repository, accessed April 5, 2025, https://archives.christuniversity.in/items/show/21294.